Skip to Content
  1. All products
  2. AFM Probes
  3. PlatformCantilever0.2 Au-Si
  4. AFM Probes
PC0P2_Au-Si_5, AFM cantilever, AFM probe (coating Au/Si, tip 5 µm, Vmicro)

Features

  • 10° TiltCompensated platform cantilever
  • 20x20µm Flat end parallel to the sample

Applications

  • Single-cell mechanics
  • Cell attachment
  • Microsphere gluing
  • Uniform, angle-compensated contact for pressure-controlled measurements
  • Cell attachment

PlatformCantilever0.2 Au-Si

300.00 € 300.00 €

QuantityPrice
  • Packaging
Add to cart
Terms and Conditions
30-day money-back guarantee
Shipping: 2-3 Business Days

Order code: PC0P2_Au-Si_5_GB10

Contact Us

Specifications

3D schematic of Vmicro PC0P2 Au-Si 5 AFM probe for platform cantilever AFM measurements
ParameterUnitNominalRange
FrequencykHz19.010-50
Spring constantN/m0.20.1-0.7
Tip height Htµm5.0nan
Tip apex radiusnm—+/-5%
Tip side angle θ°180.0+/-0.5°
Tip-cantilever angle α°101.0+/-0.5°
Cantilever length Lcµm400.0+/-1
Cantilever width Wcµm20.0+/-1
Cantilever thickness Tcµm2.5+/-0.15
Cantilever backside coatingAu
Tip-side coatingUncoated
Tip and cantilever materialp-doped Silicon 0.01-0.02 ohm-cm
Chip dimensionsmm3.4x1.6x0.4

Cantilever & tip details

SEM full-view image of Vmicro PC0P2 Au-Si 5 AFM probe showing complete probe geometry
SEM image of AFM platform tip with 10° tilted flat-end and 20x20 µm surface parallel to the sample, shaft length 5 µm.
  • Tilt-compensated flat-end platform Designed to keep the contact surface parallel to the sample when mounted in a commercial AFM probe holder.
  • 20 × 20 µm flat surface Provides a controlled contact area for force measurements and colloidal-probe applications.
  • Shaft height 5 µm Offers clearance for measurements on structured or difficult-to-access samples.
  • Stable silicon cantilever Combines reproducible mechanical properties with a well-defined platform geometry.