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PCP01_Au-Si_20, AFM cantilever, AFM probe (coating Au/Si, tip 20 µm, Vmicro)

Features

  • 10° TiltCompensated platform cantilever
  • 20x20µm Flat end parallel to the sample
  • 20µm long shaft

Applications

  • Single-cell mechanics
  • Cell attachment
  • Microsphere gluing
  • Uniform, angle-compensated contact for pressure-controlled measurements
  • Cell attachment

PlatformCantilever0.01 Au-Si

300.00 € 300.00 €

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Order code: PCP01_Au-Si_20_GB10

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Specifications

3D schematic of Vmicro PCP01 Au-Si 20 AFM probe for platform cantilever AFM measurements
ParameterUnitNominalRange
FrequencykHz3.01-10
Spring constantN/m0.010.005-0.05
Tip height Htµm20.0nan
Tip apex radiusnm—+/-5%
Tip side angle θ°180.0+/-0.5°
Tip-cantilever angle α°101.0+/-0.5°
Cantilever length Lcµm400.0+/-1
Cantilever width Wcµm20.0+/-1
Cantilever thickness Tcµm1.0+/-0.15
Cantilever backside coatingAu
Tip-side coatingUncoated
Tip and cantilever materialp-doped Silicon 0.01-0.02 ohm-cm
Chip dimensionsmm3.4x1.6x0.4

Cantilever & tip details

SEM full-view image of Vmicro PCP01 Au-Si 20 AFM probe showing complete probe geometry
SEM image of AFM platform tip with 10° tilted flat-end and 20x20 µm surface parallel to the sample, shaft length 20 µm.
  • Tilt-compensated flat-end platform Designed to keep the contact surface parallel to the sample when mounted in a commercial AFM probe holder.
  • 20 × 20 µm flat surface Provides a controlled contact area for force measurements and colloidal-probe applications.
  • Shaft height 20 µm Offers clearance for measurements on structured or difficult-to-access samples.
  • Stable silicon cantilever Combines reproducible mechanical properties with a well-defined platform geometry.