Skip to Content

Lprobes® — 特許取得済みの面内シリコン技術を採用した AFM プローブ

Vmicro Lprobes silicon AFM probes, tips and cantilevers

AFM Probes shop

By Application

Tapping mode AFM probes for high-resolution topography Tapping Tapping Mode AFM Probe Force modulation AFM probes with intermediate force constants Force Modulation Intermediate force constant AFM probes for force-distance, PeakForce Tapping and force-volume modes Force-distance modes Peakforce Tapping, Pinpoint, Force Volume AFM probes compatible with Bruker ScanAsyst mode ScanAsyst compatible Probes compatible with ScanAsyst® mode AFM probes compatible with Nanosurf WaveMode Wavemode compatible Probes compatible with the Nanosurf Wavemode AFM probes for life science and soft biological samples Life Sciences Biological or soft samples XLprobes with ultralong AFM tips for deep structures XLprobes Ultralong tips Conductive AFM probes for electrical measurements Conductive Electrical measurements TERS probes for tip-enhanced Raman spectroscopy TERS Tip enhanced raman spectroscopy s-SNOM probes for infrared nano-imaging and spectroscopy s-SNOM s-SNOM Probes for IR s-SNOM probes for infrared and terahertz nano-imaging s-SNOM THz s-SNOM Probes for IR & THz Tipless platform AFM cantilevers with tilt-compensated surfaces Platform Cantilevers Tilt compensated flat surface

By Coating

Uncoated silicon AFM probes Uncoated AFM probes with reflective aluminum backside coating Reflective Aluminum AFM probes with reflective gold coating Reflective Gold AFM probes with conductive platinum coating Conductive Platinum AFM probes with application-specific coatings Specific coatings

Test Sample Shop

Ready-to-use AFM test samples Test samples

Lprobe® and XLprobe® are registered trademarks of Vmicro SAS

ScanAsyst® is a registered trademark of Bruker Corporation

PeakForce Tapping® is a trademark of Bruker Corporation

WaveMode™ is a proprietary mode of Nanosurf

True Non-Contact™ and Pinpoint™ are trademarks of Park Systems Corp