Lprobes® — 採用專利平面矽技術的 AFM 探針

Vmicro Lprobes silicon AFM probes, tips and cantilevers

AFM Probes shop

By Application

Tapping mode AFM probes for high-resolution topography

Tapping Tapping Mode AFM Probe

Force modulation AFM probes with intermediate force constants

Force Modulation Intermediate force constant

AFM probes for force-distance, PeakForce Tapping and force-volume modes

Force-distance modes Peakforce Tapping, Pinpoint, Force Volume

AFM probes compatible with Bruker ScanAsyst mode

ScanAsyst compatible Probes compatible with ScanAsyst® mode

AFM probes compatible with Nanosurf WaveMode

Wavemode compatible Probes compatible with the Nanosurf Wavemode

AFM probes for life science and soft biological samples

Life Sciences Biological or soft samples

XLprobes with ultralong AFM tips for deep structures

XLprobes Ultralong tips

Conductive AFM probes for electrical measurements

Conductive Electrical measurements

TERS probes for tip-enhanced Raman spectroscopy

TERS Tip enhanced raman spectroscopy

s-SNOM probes for infrared nano-imaging and spectroscopy

s-SNOM s-SNOM Probes for IR

s-SNOM probes for infrared and terahertz nano-imaging

s-SNOM THz s-SNOM Probes for IR & THz

Tipless platform AFM cantilevers with tilt-compensated surfaces

Platform Cantilevers Tilt compensated flat surface

By Coating

Uncoated silicon AFM probes

AFM probes with reflective aluminum backside coating

Reflective Aluminum

AFM probes with reflective gold coating

Reflective Gold

AFM probes with conductive platinum coating

Conductive Platinum

AFM probes with application-specific coatings

Specific coatings

Test Sample Shop

Ready-to-use AFM test samples

Lprobe® and XLprobe® are registered trademarks of Vmicro SAS

ScanAsyst® is a registered trademark of Bruker Corporation

PeakForce Tapping® is a trademark of Bruker Corporation

WaveMode™ is a proprietary mode of Nanosurf

True Non-Contact™ and Pinpoint™ are trademarks of Park Systems Corp