LT040 Al-Si 30 AFM Probe | Lprobe Tapping

특징

Parameter	Unit	Nominal	Range
Frequency	kHz	300.0	200-350
Spring constant	N/m	40.0	24-55
Tip height H_t	µm	30.0	15-50
Tip apex radius	nm	7.0	2-10
Tip side angle θ	°	15.0	+/-0.5°
Tip-cantilever angle α	°	118.0	+/-0.5°
Cantilever length L_c	µm	115.0	+/-1
Cantilever width W_c	µm	40.0	+/-1
Cantilever thickness T_c	µm	3.3	+/-0.15
Cantilever backside coating	Al
Tip-side coating	Uncoated
Tip and cantilever material	p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions	mm	3.4x1.6x0.4

Technical data

Parameter	Unit	Nominal	Range
Frequency	kHz	300	200-350
Spring constant	N/m	40	24-55
Tip height H_t	µm	30	15-50
Tip apex radius	nm	7	2-10
Tip side angle θ	°	15	± 0.5
Tip-cantilever angle α	°	118	± 0.5
Cantilever length L_c	µm	115	± 1
Cantilever width W_c	µm	40	± 1
Cantilever thickness T_c	µm	3.3	± 0.5
Cantilever backside coating	Aluminum
Tip side coating	Uncoated
Tip and cantilever material	p-type Silicon 0.01–0.02 Ω·cm
Chip dimensions	mm	3.4 × 1.6 × 0.4

Probe geometry

Compensates for the AFM head mounting angle, ensuring accurate data on diverse sample surfaces.

Enables imaging of deeper or difficult-to-access sample regions.

Minimizes tip-sample convolution, ensuring more accurate morphological measurements.

Provides reliable resolution for advanced AFM applications.