LT040 Al-Si 30 AFM Probe | Lprobe Tapping

Features

Topography imaging in oscillating modes
- Tapping mode
- Non-contact mode
- True non-contact^TM
Roughness measurements
Nanoscale imaging on highly corrugated samples
Challenging aspect ratios

Parameter	Unit	Nominal	Range
Frequency	kHz	300.0	200-350
Spring constant	N/m	40.0	24-55
Tip height H_t	µm	30.0	15-50
Tip apex radius	nm	7.0	2-10
Tip side angle θ	°	15.0	+/-0.5°
Tip-cantilever angle α	°	118.0	+/-0.5°
Cantilever length L_c	µm	115.0	+/-1
Cantilever width W_c	µm	40.0	+/-1
Cantilever thickness T_c	µm	3.3	+/-0.15
Cantilever backside coating	Al
Tip-side coating	Uncoated
Tip and cantilever material	p-doped Silicon 0.01-0.02 ohm-cm
Chip dimensions	mm	3.4x1.6x0.4

Tilted tip design Compensates for the AFM head mounting angle, ensuring accurate data on diverse sample surfaces.
Tip height 30 µm Enables imaging of deeper or difficult-to-access sample regions.
Tip side angle 15° Minimizes tip-sample convolution for more accurate morphological measurements.
Tip apex radius 7 nm Provides reliable resolution for advanced AFM applications.

Technical data

Parameter	Unit	Nominal	Range
Frequency	kHz	300	200-350
Spring constant	N/m	40	24-55
Tip height H_t	µm	30	15-50
Tip apex radius	nm	7	2-10
Tip side angle θ	°	15	± 0.5
Tip-cantilever angle α	°	118	± 0.5
Cantilever length L_c	µm	115	± 1
Cantilever width W_c	µm	40	± 1
Cantilever thickness T_c	µm	3.3	± 0.5
Cantilever backside coating	Aluminum
Tip side coating	Uncoated
Tip and cantilever material	p-type Silicon 0.01–0.02 Ω·cm
Chip dimensions	mm	3.4 × 1.6 × 0.4

Probe geometry

Compensates for the AFM head mounting angle, ensuring accurate data on diverse sample surfaces.

Enables imaging of deeper or difficult-to-access sample regions.

Minimizes tip-sample convolution, ensuring more accurate morphological measurements.

Provides reliable resolution for advanced AFM applications.